Title :
Representation of Saturation in Synchronous Machines
Author :
de Mello, F. P. ; Hannett, L. N.
Author_Institution :
Power Technologies, Inc., Schenectady, NY
Keywords :
Books; Circuit testing; Data models; Integrated circuit modeling; Load flow; Load forecasting; Load modeling; Mathematical model; Power system reliability; Predictive models; Publishing; Reliability; Security; Steady-state; Synchronous machines; System testing;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1986.5527463
