• DocumentCode
    1269515
  • Title

    Generalized n+2 state system Markov model for station-oriented reliability evaluation

  • Author

    Billinton, R. ; Chen, Hua ; Zhou, Jiaqi

  • Author_Institution
    Dept. of Electr. Eng., Saskatchewan Univ., Saskatoon, Sask., Canada
  • Volume
    12
  • Issue
    4
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    1511
  • Lastpage
    1517
  • Abstract
    Practical restorative actions and existing dependencies in stations cannot be completely represented using a conventional three state model. In order to overcome these weaknesses, system state transition models for eight types of failure event have been established and a “generalized n+2 state system Markov model” is proposed in this paper. Factors such as detailed switching procedures, stuck breaker conditions and normally open components can be incorporated using the generalized model. The numerical comparisons show that the differences between the results calculated using the generalized n+2 state system model and three state component model are significant in some cases, particularly for high level outages, The generalized n+2 state system model is a more accurate model compared to the conventional three state model. It allows more factors to be considered and is more flexible in form
  • Keywords
    Markov processes; failure analysis; power system reliability; substations; failure event; generalized n+2 state system Markov model; generating stations; normally open components; power system reliability; restorative actions; station-oriented reliability evaluation; stuck breaker conditions; substations; switching procedures; switching stations; system state transition models; three state component model; Circuit faults; Energy exchange; Power generation; Power system faults; Power system modeling; Power system reliability; Power system security; Power systems; Reliability engineering; Substations;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.627850
  • Filename
    627850