• DocumentCode
    1269973
  • Title

    On the Modeling of Losses in Short Length Photonic Crystal Waveguides

  • Author

    Cryan, Martin J.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
  • Volume
    27
  • Issue
    21
  • fYear
    2009
  • Firstpage
    4841
  • Lastpage
    4847
  • Abstract
    The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.
  • Keywords
    elemental semiconductors; finite difference time-domain analysis; optical losses; optical waveguide theory; photonic crystals; silicon; 3-D finite difference time domain cut-back method; Bloch mode; FDTD; Fabry-Perot oscillations; Si; back reflections; group index; losses; meshing effects; photonic crystal waveguides; silicon membrane; Photonic crystals;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2009.2028658
  • Filename
    5184918