DocumentCode
1270446
Title
Synthesized Aluminum Nanowires for Future Interconnects [Nanopackaging]
Author
Hwang, Sungwoo ; Baik, Chan-Wook ; Whang, Dongmok
Author_Institution
Samsung Adv. Inst. of Technol. (SAIT), Yongin, South Korea
Volume
6
Issue
3
fYear
2012
Firstpage
24
Lastpage
26
Abstract
Although the Al interconnect became an old technology that was already replaced by Cu, the world of bottom-up synthesis could give the old Al a new opportunity. While there is not much data in relation to bottom-up synthesized Cu nanowires, this stress-induced grown AlNWs show almost ideal resistivity originated from perfect surface without grain boundaries. It also showed low loss microwave transmission over 100 GHz, and the breakdown current is much larger than that of patterned interconnects. One difficulty of such bottom-up synthesized nanowires is the accurate alignment of the nanowires at the designated position. There are several works that provide possible clues to this problem. The dielectrophoretic alignment and solution-based Langmuir-Blodgett technique are some examples.
Keywords
aluminium; copper; nanowires; Al; Al interconnect; Cu; Cu nanowires; breakdown current; dielectrophoretic alignment; low loss microwave transmission; solution-based Langmuir-Blodgett technique; stress-induced grown AlNW; synthesized aluminum nanowire; Aluminum; Conductivity; Electric breakdown; Grain boundaries; Interconnected systems; Nanowires; Rough surfaces; Semiconductor devices; Very large scale integration;
fLanguage
English
Journal_Title
Nanotechnology Magazine, IEEE
Publisher
ieee
ISSN
1932-4510
Type
jour
DOI
10.1109/MNANO.2012.2203879
Filename
6279552
Link To Document