• DocumentCode
    1270446
  • Title

    Synthesized Aluminum Nanowires for Future Interconnects [Nanopackaging]

  • Author

    Hwang, Sungwoo ; Baik, Chan-Wook ; Whang, Dongmok

  • Author_Institution
    Samsung Adv. Inst. of Technol. (SAIT), Yongin, South Korea
  • Volume
    6
  • Issue
    3
  • fYear
    2012
  • Firstpage
    24
  • Lastpage
    26
  • Abstract
    Although the Al interconnect became an old technology that was already replaced by Cu, the world of bottom-up synthesis could give the old Al a new opportunity. While there is not much data in relation to bottom-up synthesized Cu nanowires, this stress-induced grown AlNWs show almost ideal resistivity originated from perfect surface without grain boundaries. It also showed low loss microwave transmission over 100 GHz, and the breakdown current is much larger than that of patterned interconnects. One difficulty of such bottom-up synthesized nanowires is the accurate alignment of the nanowires at the designated position. There are several works that provide possible clues to this problem. The dielectrophoretic alignment and solution-based Langmuir-Blodgett technique are some examples.
  • Keywords
    aluminium; copper; nanowires; Al; Al interconnect; Cu; Cu nanowires; breakdown current; dielectrophoretic alignment; low loss microwave transmission; solution-based Langmuir-Blodgett technique; stress-induced grown AlNW; synthesized aluminum nanowire; Aluminum; Conductivity; Electric breakdown; Grain boundaries; Interconnected systems; Nanowires; Rough surfaces; Semiconductor devices; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1932-4510
  • Type

    jour

  • DOI
    10.1109/MNANO.2012.2203879
  • Filename
    6279552