DocumentCode :
127059
Title :
System level accelerated demonstration tests design: Approach and application
Author :
Kang Rui ; Wang Wenyu ; Ma Xiaobing ; Chen Qinfeng
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
fYear :
2014
fDate :
27-30 Jan. 2014
Firstpage :
1
Lastpage :
6
Abstract :
System level accelerated demonstration tests design considering dispersion of accelerated factor synthesizes traditional risk deriving from life distribution of batch products and risk in model selection. The key is to find the equivalent dispersion of accelerated factor on system level from accelerated factor dispersion of components, life distribution of components and structure of system. In other words, based on system structure, with information of components, we have synthesized the risk from life distribution and model selection. With the help of dispersion of accelerated factors, we can design verification testing for system with one sample and make a comprehensive assessment of system reliability with multiple samples. There are several advantage of proposed approach: 1, we can verify the life of products considering its scatter factor with only one sample, which cannot be achieved with traditional framework; 2, we can estimate the lower confidence limit of products life with a small sample size; 3, the risk of model selection is considered in test design.
Keywords :
batch production systems; life testing; product design; reliability; accelerated factor dispersion; accelerated factor equivalent dispersion; batch products; component information; component life distribution; life distribution; model selection risk; product life confidence estimation; system level accelerated demonstration test design; system reliability comprehensive assessment; system structure; verification testing design; Acceleration; Dispersion; Exponential distribution; Life estimation; Reliability; Stress; Testing; Accelerated Factor; Accelerated Life Testing (ALT); Life Estimation; Life Verification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2014 Annual
Conference_Location :
Colorado Springs, CO
Print_ISBN :
978-1-4799-2847-7
Type :
conf
DOI :
10.1109/RAMS.2014.6798477
Filename :
6798477
Link To Document :
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