DocumentCode :
1270808
Title :
Totally self-checking checker designs for Bose-Lin, Bose, and Blaum codes
Author :
Jha, Niraj K.
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Volume :
10
Issue :
1
fYear :
1991
fDate :
1/1/1991 12:00:00 AM
Firstpage :
136
Lastpage :
143
Abstract :
The totally self-checking (TSC) circuit concept is well established in the area of concurrent error detection (CED). The outputs of a functional circuit are encoded and are monitored by a TSC checker. Thus errors can be detected concurrently with normal operation. Both permanent and transient faults can be detected. Some efficient systematic codes have been developed for detecting unidirectional errors in t or fewer bits (Bose-Lin code) and for detecting burst unidirectional errors (Bose and Blaum codes). Since unidirectional errors are the most common errors in VLSI circuits, such codes should find widespread use. TSC checker designs have been found for the three codes mentioned above. The designs are easily testable, relatively economical, and have a modular structure
Keywords :
VLSI; automatic testing; coding errors; error detection codes; fault location; integrated circuit testing; logic design; logic testing; Blaum codes; Bose code; Bose-Lin code; VLSI circuits; burst unidirectional errors; concurrent error detection; fault location; modular structure; permanent faults; self-checking checker; transient faults; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Encoding; Error correction codes; Fault detection; Monitoring; Protection; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.62799
Filename :
62799
Link To Document :
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