DocumentCode :
1270999
Title :
Memory power models for multilevel power estimation and optimization
Author :
Schmidt, Eike ; Von Cölln, Gerd ; Kruse, Lars ; Theeuwen, Frans ; Nebel, Wolfgang
Author_Institution :
Kuratorium OFFIS e.V., Oldenburg, Germany
Volume :
10
Issue :
2
fYear :
2002
fDate :
4/1/2002 12:00:00 AM
Firstpage :
106
Lastpage :
109
Abstract :
Storage cost is a major factor in the total power consumption of digital signal processing circuits. Power models for on-chip memories are consequently an important ingredient in power aware design flows for estimation and optimization. Unfortunately, exact memory-modeling techniques are not widely applied in practice. This is mainly due to the vendors´ need for intellectual property protection (IPP), the ill fit into vendors´ design cycles and the significant overhead in time and manpower involved. To bridge the gap, between vendors and designers, we suggest an automatic black box modeling approach. It is based on nonlinear regression that combines all desired properties: accuracy, flexibility, speed, low overhead, a good fit into the vendors´ design cycle, IP protection, plus a mathematical form that is well suited for optimization.
Keywords :
cache storage; circuit CAD; circuit optimisation; digital signal processing chips; industrial property; integrated circuit design; integrated circuit modelling; low-power electronics; statistical analysis; accuracy; automatic black box modeling approach; design cycles; digital signal processing circuits; flexibility; intellectual property protection; memory power models; nonlinear regression; on-chip memories; optimization; overhead; power aware design flows; speed; storage cost; total power consumption; Application specific integrated circuits; Bridge circuits; Cost function; Design optimization; Digital signal processing; Energy consumption; Intellectual property; Interpolation; Protection; Registers;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.994987
Filename :
994987
Link To Document :
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