Title :
A life prediction approach based on integrated failure information
Author :
Wentao Li ; Xiaoyang Li ; Tongmin Jiang
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
In this paper a Bayesian method is introduced to evaluate products´ life by integrating the failure information in field and prior failure information collected from various sources. Calibrators are used to calibrate the difference between failure information in field and prior failure information, then Bayesian approach can be used to integrate failure data. The posterior distributions of unknown parameters can be obtained through statistical inference procedure, which is carried out through Markov chain and Monte Carlo (MCMC) method. Normal distribution and 2-parameters Weibull distribution are discussed based on the fusion model established, and simulation examples are performed to illustrate the use of proposed method. The orthogonal analysis shows the influence of different chosen values to prior means of unknown parameters on prediction results.
Keywords :
Markov processes; Monte Carlo methods; Weibull distribution; failure analysis; life testing; normal distribution; Bayesian method; MCMC; Markov chain-Monte Carlo method; Weibull distribution; integrated failure information; normal distribution; orthogonal analysis; posterior distributions; product life evaluation; product life prediction approach; Bayes methods; Educational institutions; Estimation; Gaussian distribution; Markov processes; Reliability; Weibull distribution; Bayesian inference; MCMC method; failure information model; life prediction;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2014 Annual
Conference_Location :
Colorado Springs, CO
Print_ISBN :
978-1-4799-2847-7
DOI :
10.1109/RAMS.2014.6798504