Title :
Analysis of degradation process with measurement errors
Author :
Rong Pan ; Wendai Wang
Author_Institution :
Sch. of Comput., Inf. & Decision Syst. Eng., Arizona State Univ., Tempe, AZ, USA
Abstract :
Degradation tests are often applied on highly reliable products when the product performance can be repeatedly measured. In this paper, we compare two common types of degradation models - a nonlinear regression model and a stochastic process model. Particularly, we discuss the effects of measurement error on model parameter estimation and model selection. Using an example of photovoltaic product degradation, we (1) demonstrate the use of linear models for estimating model parameters, and (2) provide a hypothesis test for the statistical significance of product performance degradation. It shows that some forms of measurement errors, such as the drifting error of tester, can be easily incorporated into the analysis of stochastic degradation models.
Keywords :
life testing; measurement errors; parameter estimation; photovoltaic cells; regression analysis; stochastic processes; degradation testing; measurement errors; nonlinear regression model; parameter estimation; photovoltaic product degradation; reliability; stochastic degradation models; stochastic process model; Analytical models; Degradation; Educational institutions; Measurement errors; Measurement uncertainty; Reliability; Stochastic processes; Degradation modeling; Hypothesis test; Linear models; Wiener process;
Conference_Titel :
Reliability and Maintainability Symposium (RAMS), 2014 Annual
Conference_Location :
Colorado Springs, CO
Print_ISBN :
978-1-4799-2847-7
DOI :
10.1109/RAMS.2014.6798513