DocumentCode :
1271521
Title :
Proposal for Switching Current Reduction Using Reference Layer With Tilted Magnetic Anisotropy in Magnetic Tunnel Junctions for Spin-Transfer Torque (STT) MRAM
Author :
Mojumder, Niladri Narayan ; Roy, Kaushik
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
59
Issue :
11
fYear :
2012
Firstpage :
3054
Lastpage :
3060
Abstract :
The design and statistical analysis of a magnetic tunnel junction with pinned-layer uniaxial anisotropy, slightly tilted with respect to the perpendicular magnetic anisotropy (PMA) of the free layer, are presented in the presence of thermally induced magnetic noise. The marginal tilting of the pinned-layer easy axis reduces the critical switching current density by almost 80%, as compared to a regular PMA device for a delay of 2 ns with a switching failure probability lower than 10-9. Substantially lower switching current density in spin-transfer torque MRAM with tilted pinned-layer anisotropy enables the use of a higher resistance-area product with a thicker tunnel barrier that compensates for the tunneling-magnetoresistance rolloff due to the relative misalignment of free- and pinned-layer easy axes.
Keywords :
MRAM devices; current density; failure analysis; magnetic tunnelling; probability; PMA device; STT MRAM; critical switching current density; magnetic tunnel junctions; perpendicular magnetic anisotropy; pinned-layer marginal tilting; pinned-layer uniaxial anisotropy; reference layer; resistance-area product; spin-transfer torque MRAM; switching current reduction; switching failure probability; thermally induced magnetic noise; tilted magnetic anisotropy; tilted pinned-layer anisotropy; time 2 ns; tunnel barrier; tunneling-magnetoresistance rolloff; Anisotropic magnetoresistance; Current density; Delay; Magnetic anisotropy; Magnetic tunneling; Switches; Tunneling magnetoresistance; Magnetic anisotropy; magnetic tunnel junction (MTJ); nonvolatile memory; spin-transfer torque (STT); tunneling magnetoresistance (TMR);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2210226
Filename :
6280657
Link To Document :
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