DocumentCode :
1272287
Title :
A Pattern Generation Technique for Maximizing Switching Supply Currents Considering Gate Delays
Author :
Ganeshpure, Kunal P. ; Sanyal, Alodeep ; Kundu, Sandip
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Massachusetts, Amherst, MA, USA
Volume :
61
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
986
Lastpage :
998
Abstract :
Computation of peak supply current is central to power rail design and analysis of power supply switching noise. Traditionally, peak switching current from all CMOS gates is added together to compute peak supply current. This approach can be improved significantly if temporal and Boolean relationships are taken into consideration. Previously, it was shown that worst case switching current in a subset of gates may imply that some other gates may not have the worst case switching condition due to logical relationship between input patterns of a gate. In this paper, we also take integer gate delays into consideration to show that gate switching events may be spaced out in time leading to lower peak current. Further, it is found that taking gate delays into account actually simplifies the size of individual problem instances to be solved, leading to both a faster and more accurate solution. Finally, we compare peak current waveform generated by the proposed solver against SPICE simulation to demonstrate effectiveness of the proposed solution.
Keywords :
CMOS integrated circuits; SPICE; VLSI; automatic test pattern generation; delay circuits; switched current circuits; Boolean relationships; CMOS gates; SPICE simulation; gate switching events; integer gate delays; pattern generation technique; peak current waveform; power supply switching noise; switching supply currents; Delay; Integrated circuit modeling; Logic gates; Power supplies; Rails; Switches; Switching circuits; Peak current analysis; gate delay.; integer linear program; pattern generation; power supply current;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2011.128
Filename :
5953588
Link To Document :
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