Two-dimensional partially functional broadside tests

Partially functional broadside tests were defined to address the tradeoff that exists between fault coverage and proximity to functional operation conditions during the application of scan-based tests for delay faults. Proximity to functional operation conditions is important for avoiding overtesting. The definition of a partially functional broadside test does not take into consideration the extent of deviation from functional operation conditions that occurs during the second pattern of a test. The authors define two-dimensional partially functional broadside tests to address this issue. The authors demonstrate through experimental results that this improves the ability of the test to remain close to functional operation conditions during the application of both patterns.