Title :
Reliability of fluoride fiber module for optical amplifier use
Author :
Nishida, Yoshiki ; Fujiura, Kazuo ; Hoshino, Koichi ; Shimizu, Makoto ; Yamada, Makoto ; Nakagawa, Koichi ; Ohishi, Yasutake
Author_Institution :
NTT Photonics Labs., Ibaraki, Japan
Abstract :
We report reliability test results for a fluoride fiber module. We developed a sealed fluoride fiber module for practical optical fiber amplifier use. Trouble-free damp heat storage and low-temperature storage for 5000 h and trouble-free temperature cycling and temperature-humidity cycling tests revealed that our fluoride fiber module has long-term stability under practical environmental conditions.
Keywords :
fluoride glasses; humidity; modules; optical fibre amplifiers; optical fibre testing; reliability; 5000 hr; environmental conditions; fluoride fiber module; long-term stability; low-temperature storage; optical amplifier use; optical components; optical fiber amplifier; reliability; temperature-humidity cycling test; trouble-free damp heat storage; trouble-free temperature cycling; Doping; Optical fiber amplifiers; Optical fiber testing; Optical fibers; Packaging; Semiconductor optical amplifiers; Silicon compounds; Splicing; Stimulated emission; Stress;
Journal_Title :
Photonics Technology Letters, IEEE
