• DocumentCode
    1273350
  • Title

    Estimation of Simultaneous Switching Noise From Frequency-Domain Impedance Response of Resonant Power Distribution Networks

  • Author

    WooPoung Kim

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • Volume
    1
  • Issue
    9
  • fYear
    2011
  • Firstpage
    1359
  • Lastpage
    1367
  • Abstract
    Simultaneous switching noise can significantly impact the performance of high-speed systems and needs to be accurately analyzed. The simulation program with integrated circuit emphasis (SPICE) transient simulation with transistor circuits, packages, and boards is the most accurate method but may require a huge computer resource and a long simulation time. Hence, an estimation method of the simultaneous switching noise from the frequency-domain impedance of power distribution networks was presented in this paper. The estimation method can quickly but still accurately calculate the simultaneous switching noise. The estimation method is validated by SPICE transient simulations with transistor models for both the terminated and unterminated systems. In high-speed systems, the difference between the estimation and the worst noise of the transient simulations is less than 20%.
  • Keywords
    SPICE; integrated circuit modelling; integrated circuit noise; transistor circuits; SPICE; frequency-domain impedance response; resonant power distribution networks; simulation program with integrated circuit emphasis; simultaneous switching noise; transient simulations; transistor circuits; Computational modeling; Estimation; Frequency domain analysis; Impedance; Integrated circuit modeling; Noise; Switches; Double data rate; low power double-data-rate; power distribution network; power distribution networks; simultaneous switching noise; simultaneous switching output; switching noise;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2157503
  • Filename
    5954164