Simulation of the off-track capability of a one terabit per square inch recording system

Author

Jin, Zhen ; Bertram, H. Neal ; Wilson, Bruce ; Wood, Roger

Author_Institution

Center for Magnetic Recording Res., California Univ., San Diego, La Jolla, CA, USA

Volume

38

Issue

2

fYear

2002

fDate

3/1/2002 12:00:00 AM

Firstpage

1429

Lastpage

1435

Abstract

We investigated the potential of extending conventional magnetic recording technology to a one terabit per square inch (Tb/in²) density using a simple model, focusing on the off-track capability of a hypothetical perpendicular recording system. Our simulation considered the medium\´s granular structure, head side reading, and side writing. However, as a first approximation, interactions between grains were neglected. We investigated the characteristics of both an isolated transition and a pseudorandom sequence. The signal-to-noise ratio is very low (around 10 dB) at such a density. Direct bit-by-bit simulation on 80000 bits of a 1023-bit pseudorandom sequence yielded the bit-error rate (BER). By changing the squeeze position of the side track, a series of "bathtub" curves was calculated and thus, 747 curves at various BER thresholds were investigated. We also studied different detection schemes and the block failure rate after error-correction code

Keywords

error correction codes; magnetic recording noise; perpendicular magnetic recording; sequences; 1 Tbit/in² recording system; BER; bathtub curves; bit-error rate; block failure rate; direct bit-by-bit simulation; error-correction code; granular structure; head side reading; isolated transition; magnetic recording technology; off-track capability simulation; perpendicular recording system; pseudorandom sequence; side track squeeze position; side writing; signal-to-noise ratio; Bit error rate; Disk recording; Error correction codes; Magnetic analysis; Magnetic heads; Magnetic recording; Perpendicular magnetic recording; Random sequences; Signal to noise ratio; Writing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.996046

Filename

996046