DocumentCode
1273436
Title
TixZr1-x underlayers for CoCrPtB perpendicular magnetic recording media
Author
Hsu, Yu-Nu ; Wierman, Kurt W. ; Lu, Bin ; Klemmer, Timothy J. ; Howard, J.Kent
Author_Institution
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
38
Issue
2
fYear
2002
fDate
3/1/2002 12:00:00 AM
Firstpage
1436
Lastpage
1440
Abstract
We describe the effects of TixZr1-x underlayers on the microstructural and magnetic properties of CoCrPtB layers. We found that as the Zr atomic composition increases in the Ti xZr1-x underlayers, the unit cells of the Tix Zr1-x underlayers expand. The TixZr1-x (0002) texture is strongest as the Zr atomic composition ranges from 40% to 60%. In addition, the CoCrPtB (0002) texture induced by the (0002) textured TixZr1-x underlayer is enhanced at these optimizing Zr compositions. The grain size of the CoCrPtB layers deposited onto the TixZr1-x, underlayers is around 7.5-9.5 nm. Stacking fault streaks observed by transmission electron microscopy indicate that stacking faults exist in the CoCrPtB films with the TixZr1-x underlayers. The Hc (coercivity) and S* (squareness) of the CoCrPtB magnetic layers deposited onto the pure Ti and Zr underlayer were higher than those with the TiZr alloy underlayers
Keywords
X-ray diffraction; boron alloys; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; magnetic hysteresis; magnetic thin films; perpendicular magnetic recording; platinum alloys; sputtered coatings; stacking faults; texture; titanium alloys; transmission electron microscopy; zirconium alloys; (0002) texture; 7.5 to 9.5 nm; CoCrPtB; CoCrPtB magnetic layers; CoCrPtB perpendicular magnetic recording media; TixZr1-x; TixZr1-x underlayers; Zr atomic composition; coercivity; grain size; magnetic properties; microstructural properties; six-target DC magnetron Lesker sputtering; squareness; stacking fault streaks; transmission electron microscopy; underlayer unit cells; Amorphous magnetic materials; Atomic layer deposition; Magnetic films; Magnetic properties; Microstructure; Perpendicular magnetic recording; Sputtering; Stacking; Substrates; Zirconium;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.996048
Filename
996048
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