Title :
Approach to classification of blurred patterns with same symmetry
Author :
Pan, Min-Cheng ; Lettington, A H
Author_Institution :
J.J. Thomson Phys. Lab., Reading Univ., UK
fDate :
9/16/1999 12:00:00 AM
Abstract :
An approach is proposed based on invariants extracted from projection maps to classify blurred patterns with the same symmetry. Results of simple, error, and true probabilities for classification are shown. Finally, a statistical curve to fit the integrated true probability is given
Keywords :
pattern classification; probability; symmetry; blurred patterns; invariants extraction; pattern classification; pattern symmetry; probabilities; projection maps; statistical curve;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991138
