• DocumentCode
    1273976
  • Title

    High-power and high temperature long-term stability of Al-free 950 nm laser structures on GaAs

  • Author

    Beister, G. ; Erbert, G. ; Knauer, A. ; Maege, J. ; Ressel, P. ; Sebastian, J. ; Staske, R. ; Wenzel, H.

  • Author_Institution
    Ferdinand-Braun-Inst. fur Hochstfrequenztech., Berlin, Germany
  • Volume
    35
  • Issue
    19
  • fYear
    1999
  • fDate
    9/16/1999 12:00:00 AM
  • Firstpage
    1641
  • Lastpage
    1643
  • Abstract
    Al-free InGaAs/InGaAsP/InGaP broad area lasers emitting at 950 nm show low degradation rates below 6×10-5/h, under conditions of 1.5 W emission power per 100 μm stripe width at 50°C and 4 W/200 μm at room temperature
  • Keywords
    III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; laser beams; laser reliability; laser stability; semiconductor lasers; 1.5 W; 100 mum; 200 mum; 298 K; 4 W; 50 C; 950 nm; Al-free laser structures; GaAs; InGaAs-InGaAsP-InGaP; InGaAs/InGaAsP/InGaP broad area lasers; broad area lasers; degradation rates; emission power; high temperature long-term stability; high-power long-term stability; room temperature; semiconductor laser diodes; stripe width;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19991152
  • Filename
    807043