Title :
Switching of Disconnectors in GIS Laboratory and Field Tests
Author :
Kynast, E. E. ; Luehrmann, H. M.
Author_Institution :
SIEMENS AG, Berlin, Germany
Keywords :
Capacitance; Circuit faults; Circuit testing; Electrodes; Frequency; Gas insulation; Geographic Information Systems; Grounding; Laboratories; Reliability; Substations; Surges; Transient analysis; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1985.5528369