• DocumentCode
    1274585
  • Title

    Bearing estimation without calibration for randomly perturbed arrays

  • Author

    Chen, Yih-Min ; Lee, Ju-Hong ; Yeh, Chien-chung ; Mar, Jeich

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    39
  • Issue
    1
  • fYear
    1991
  • fDate
    1/1/1991 12:00:00 AM
  • Firstpage
    194
  • Lastpage
    197
  • Abstract
    The bearing estimation problem of linearly periodic arrays with the presence of sensor position errors is discussed. Conventional approaches for solving this problem generally consist of two steps: calibrating sensor locations and then performing bearing estimation based on the calibrated sensor locations. Approaches to carrying out bearing estimation based on the Toeplitz and eigenstructure reconstruction of the covariance matrix without the need for calibration are proposed. The Toeplitz approximation method (TAM) and a modification of it (MTAM) are used to reconstruct a matrix with Toeplitz structure. To further enhance the capabilities of the TAM and MTAM, an iterative algorithm incorporating with the TAM (ITAM) and the MTAM (IMTAM) is proposed to iteratively reconstruct both the Toeplitz and the desired eigenstructure from the observed covariance matrix. Computer simulations show that the MTAM is more effective than the TAM. Moreover, the iterative methods are superior to the noniterative ones at the price of computations
  • Keywords
    iterative methods; signal processing; Toeplitz approximation; Toeplitz matrix; array processing; bearing estimation; covariance matrix; eigenstructure reconstruction; iterative algorithm; linearly periodic arrays; randomly perturbed arrays; sensor position errors; Approximation methods; Calibration; Computer simulation; Covariance matrix; Direction of arrival estimation; Gold; Iterative algorithms; Iterative methods; Random variables; Sensor arrays;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/78.80780
  • Filename
    80780