Title :
A 2/3-in 2.0 M-pixel CCD imager with an advanced M-FIT architecture capable of progressive scan
Author :
Itakura, K. ; Nobusada, T. ; Toyoda, Y. ; Saitou, Y. ; Kokusenya, N. ; Nagayoshi, R. ; Ozaki, M. ; Sugawara, Y. ; Mitani, K. ; Fujita, Y.
Author_Institution :
Electron. Res. Lab., Matsushita Electron. Corp., Osaka, Japan
fDate :
10/1/1997 12:00:00 AM
Abstract :
A 2/3-in 2.0 M-pixel CCD imager with an advanced multiple frame-interline transfer (M-FIT) architecture has been developed. The architecture features highly improved sensor performance and progressive-scan capability. The experimentally fabricated device achieves the sensitivity of 44 nA/lx, saturation current of 580 nA, and smear level of -100 dB
Keywords :
CCD image sensors; sensitivity; synchronisation; 0.667 in; 2 Mpixel; 580 nA; CCD imager; M-FIT architecture; multiple frame-interline transfer; progressive scan; saturation current; sensor performance; smear level; Blanking; Charge coupled devices; Charge transfer; Circuit noise; Diodes; Image storage; Noise generators; Noise reduction; Pixel; Timing;
Journal_Title :
Electron Devices, IEEE Transactions on
