DocumentCode
1275193
Title
Temperature and optical characteristics of tin oxide membrane gate ISFET
Author
Liao, Hung-Kwei ; Yang, En-Shieh ; Chou, Jung-Chuan ; Chung, Wen-Yaw ; Sun, Tai-Ping ; Hsiung, Shen-Kan
Author_Institution
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chung Li, Taiwan
Volume
46
Issue
12
fYear
1999
fDate
12/1/1999 12:00:00 AM
Firstpage
2278
Lastpage
2281
Abstract
The influence of temperature and optical effects on ISFET performance are important. In this study, the temperature characteristics of the SnO2/Si3N4/SiO 2/Si ISFET are investigated by the zero temperature coefficient (T.C.) adjustment and the dual FET´s configuration, respectively. The result show that a zero T.C. of the SnO2 gate ISFET can be achieved when the appropriate operation current was set. Subsequently, the T.C. of tin oxide membrane/electrolyte interface can be evaluated by the dual FETs configuration. On the other hand, due to the SnO2 gate ISFET is sensitive to the light exposure, thus in order to improve this drawback, a multi-structure ISFETs: SnO 2/Al/SiO2/Si3N4/Si ISFETs have been developed. In this structure, aluminum is used as a light shield, and the tin oxide is used as a pH sensitive layer. The results show the ISFETs with aluminum as a light shield have low light sensitivity compared with ISFETs without aluminum as a light shield
Keywords
ion sensitive field effect transistors; membranes; semiconductor materials; tin compounds; ISFET; SnO2-Al-SiO2-Si3N4-Si; SnO2-Si3N4-SiO2-Si; aluminum light shield; dual FET; optical characteristics; pH sensitive layer; temperature characteristics; tin oxide membrane/electrolyte interface; zero temperature coefficient; Aluminum; Biomembranes; Chemicals; FETs; Optical films; Optical materials; Optical sensors; Sun; Temperature sensors; Tin;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.808051
Filename
808051
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