Title :
New Short-Circuit Testing Facilities to Cope With the Recent Development of GIS
Author :
Yamamoto, M. ; Yamashita, S. ; Ikeda, H. ; Yanabu, S.
Author_Institution :
Toshiba Corporation, Kawasaki, Japan
Keywords :
Capacitors; Circuit breakers; Circuit testing; Current supplies; Dielectrics; Geographic Information Systems; Insulation; Power transformer insulation; Sulfur hexafluoride; Surges; Switches; Transient analysis; Valves; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1985.5528561
