Title :
Future of low-power chips
fDate :
8/1/2009 12:00:00 AM
Abstract :
Engineers at the U.S. National Institute of Standards and Technology (NIST) say that the basic theory explaining the origin of a certain type of noise produced by very small transistors is totally wrong
Keywords :
Circuit noise; Electrons; Failure analysis; Insulation; NIST; Noise reduction; Read-write memory; Telegraphy; Transistors; Tunneling;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.2009.5186536
