DocumentCode
1275446
Title
Future of low-power chips
Author
Moore, S.K.
Volume
46
Issue
8
fYear
2009
fDate
8/1/2009 12:00:00 AM
Firstpage
16
Lastpage
16
Abstract
Engineers at the U.S. National Institute of Standards and Technology (NIST) say that the basic theory explaining the origin of a certain type of noise produced by very small transistors is totally wrong
Keywords
Circuit noise; Electrons; Failure analysis; Insulation; NIST; Noise reduction; Read-write memory; Telegraphy; Transistors; Tunneling;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.2009.5186536
Filename
5186536
Link To Document