DocumentCode :
1275524
Title :
Deep submicron cmos current ic testing: is there a future
Author :
Hawkins, C.F.
Volume :
16
Issue :
4
fYear :
1999
Firstpage :
14
Lastpage :
15
Keywords :
Ammeters; Bridge circuits; CMOS integrated circuits; CMOS technology; Integrated circuit testing; Measurement techniques; Optical modulation; Optical sensors; Reduced instruction set computing; Threshold voltage;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1999.808198
Filename :
808198
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1275524
