• DocumentCode
    1275524
  • Title

    Deep submicron cmos current ic testing: is there a future

  • Author

    Hawkins, C.F.

  • Volume
    16
  • Issue
    4
  • fYear
    1999
  • Firstpage
    14
  • Lastpage
    15
  • Keywords
    Ammeters; Bridge circuits; CMOS integrated circuits; CMOS technology; Integrated circuit testing; Measurement techniques; Optical modulation; Optical sensors; Reduced instruction set computing; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1999.808198
  • Filename
    808198
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1275524