DocumentCode
127553
Title
Why testing digital relays are becoming so difficult! Part 1
Author
Vandiver, Benton
Author_Institution
OMICRON Electron., Los Angeles, CA, USA
fYear
2014
fDate
March 31 2014-April 3 2014
Firstpage
581
Lastpage
587
Abstract
This paper identifies some of the developing issues in testing what has here to fore been well understood protection elements we commonly used in designing modern protection systems. The core issue is the complexity of the combined protection element scheme logic that enables these “understood” protection elements to function more securely and reliably - but also prevent us from using legacy testing techniques like “constant test current” or “step change/state sequencing” to verify the set characteristic. Additionally, it makes a comparison of the commonly used test methods (constant current/constant voltage) focusing on common distance elements of Mho´s and Quad´s and how these now fall short in properly generating what the relay expects of a power system fault simulation. It identifies why these methods fall short, under what conditions they can and should be used and which lesser known test method should now be used to properly test all aspects of these distance characteristics.
Keywords
power system faults; relay protection; relays; testing; constant test current; digital relay testing; legacy testing techniques; power system fault simulation; protection element scheme logic; protection systems; step change/state sequencing; Guidelines; Security; Timing; Distance; Protection system; characteristic; relay; testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Protective Relay Engineers, 2014 67th Annual Conference for
Conference_Location
College Station, TX
Print_ISBN
978-1-4799-4740-9
Type
conf
DOI
10.1109/CPRE.2014.6799029
Filename
6799029
Link To Document