• DocumentCode
    127553
  • Title

    Why testing digital relays are becoming so difficult! Part 1

  • Author

    Vandiver, Benton

  • Author_Institution
    OMICRON Electron., Los Angeles, CA, USA
  • fYear
    2014
  • fDate
    March 31 2014-April 3 2014
  • Firstpage
    581
  • Lastpage
    587
  • Abstract
    This paper identifies some of the developing issues in testing what has here to fore been well understood protection elements we commonly used in designing modern protection systems. The core issue is the complexity of the combined protection element scheme logic that enables these “understood” protection elements to function more securely and reliably - but also prevent us from using legacy testing techniques like “constant test current” or “step change/state sequencing” to verify the set characteristic. Additionally, it makes a comparison of the commonly used test methods (constant current/constant voltage) focusing on common distance elements of Mho´s and Quad´s and how these now fall short in properly generating what the relay expects of a power system fault simulation. It identifies why these methods fall short, under what conditions they can and should be used and which lesser known test method should now be used to properly test all aspects of these distance characteristics.
  • Keywords
    power system faults; relay protection; relays; testing; constant test current; digital relay testing; legacy testing techniques; power system fault simulation; protection element scheme logic; protection systems; step change/state sequencing; Guidelines; Security; Timing; Distance; Protection system; characteristic; relay; testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Protective Relay Engineers, 2014 67th Annual Conference for
  • Conference_Location
    College Station, TX
  • Print_ISBN
    978-1-4799-4740-9
  • Type

    conf

  • DOI
    10.1109/CPRE.2014.6799029
  • Filename
    6799029