Title :
Hierarchical design and test of integrated microsystems
Author :
Mukherjee, Tridib ; Fedder, Gary K. ; Blanton, R.D.
Author_Institution :
Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This article presents emerging results of an integrated mixed-domain design methodology similar to the mixed-signal design methodologies in the VLSI community. This methodology is based on a hierarchical mixed-domain design representation and includes a Spice-like nodal simulation environment, an “on-the-fly” component layout-synthesis module, a layout extractor for design verification, and a fault model generator for test methodology development
Keywords :
logic CAD; logic testing; Spice-like nodal simulation; design verification; fault model generator; integrated microsystems; integrated mixed-domain design; mixed-domain design representation; test methodology development; CMOS process; CMOS technology; Chemical technology; Design methodology; Etching; Micromachining; Micromechanical devices; Microstructure; Silicon; Testing;
Journal_Title :
Design & Test of Computers, IEEE
