DocumentCode
1275637
Title
ITC 99 panels
Author
Bhovsar, D.
Volume
16
Issue
4
fYear
1999
Firstpage
96
Lastpage
99
Keywords
Automatic test pattern generation; Design for testability; Educational institutions; Graphics; Logic devices; Logic testing; Manufacturing; National electric code; Production; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1999.808229
Filename
808229
Link To Document