DocumentCode
1275672
Title
Isochronism defect for various doubly rotated cut quartz resonators
Author
Gufflet, Nicolas ; Bourquin, Roger ; Boy, Jean-Jacques
Author_Institution
ENSMM/LCEP, Besancon, France
Volume
49
Issue
4
fYear
2002
fDate
4/1/2002 12:00:00 AM
Firstpage
514
Lastpage
518
Abstract
It has been shown in earlier works that the amplitude-frequency effect [also called isochronism defect (ID) or anisochronism] could be a limitation factor on ultrastable oscillators. Theoretical studies based on the nonlinear theory of piezoelectricity have already been developed to explain the amplitude-frequency effect. So, it is possible to estimate the dependence of the ID versus various parameters of the resonator design (overtone rank, radius of curvature, electrodes diameter, etc.). However, because of the lack of available fourth-order elastic coefficients, it is not possible to predict the ID of any resonant frequency of a given trapped energy resonator. To tentatively find orientations of plates exhibiting a quasi-null ID, we have realized electroded resonators with different orientations and curvatures. We present results that verify, particularly, the R/sup -1/2/ dependence of the amplitude-frequency effect versus radius of curvature. Moreover, we show that the ID can be positive or negative, that it can vary from one orientation to other one of about one order of magnitude, and that there exists a thermal compensated mode for which the amplitude-frequency effect is null.
Keywords
compensation; crystal resonators; quartz; resonance; stability; SiO/sub 2/; amplitude-frequency effect; anisochronism; doubly rotated cut quartz resonators; electrode diameter; electroded resonators; isochronism defect; overtone rank; plate orientations; radius of curvature; thermal compensated mode; ultra-stable oscillators; Amplitude estimation; Dielectrics; Ear; Electrodes; Frequency estimation; Noise level; Oscillators; Phase noise; Piezoelectricity; Stability;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/58.996571
Filename
996571
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