DocumentCode :
1275925
Title :
Testing and estimation for variable single evoked brain potentials
Author :
Mocks, J. ; Gasser, T. ; Tuan, P.D.
Author_Institution :
Boehringer Mannheim GmbH, West Germany
Volume :
9
Issue :
1
fYear :
1990
fDate :
3/1/1990 12:00:00 AM
Firstpage :
40
Lastpage :
43
Abstract :
The task of validly quantifying variations in electrical activity recorded when the brain is processing external or internal events is addressed. Three new statistical tests sensitive to different types of response changes, which test the null hypothesis that there is a homogeneous signal, are presented. In the case of latency jitter, the testing procedure was developed together with a procedure for estimating the unknown signal shifts. The tests provide a statistically valid and powerful tool in investigating signal variation, even with strong colored noise. Moreover, the differential sensitivity to different types of variations allows a study of the underlying signal variability even though the single signal cannot be estimated.<>
Keywords :
bioelectric potentials; brain; electroencephalography; signal detection; statistical analysis; differential sensitivity; homogeneous signal; latency jitter; null hypothesis; response changes; signal shifts; signal variation; statistical tests; testing procedure; variable single evoked brain potentials; variations in electrical activity; Background noise; Biological system modeling; Brain modeling; Delay; Electroencephalography; Psychology; Signal to noise ratio; Smoothing methods; Statistical analysis; Testing;
fLanguage :
English
Journal_Title :
Engineering in Medicine and Biology Magazine, IEEE
Publisher :
ieee
ISSN :
0739-5175
Type :
jour
DOI :
10.1109/51.62903
Filename :
62903
Link To Document :
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