• DocumentCode
    1275925
  • Title

    Testing and estimation for variable single evoked brain potentials

  • Author

    Mocks, J. ; Gasser, T. ; Tuan, P.D.

  • Author_Institution
    Boehringer Mannheim GmbH, West Germany
  • Volume
    9
  • Issue
    1
  • fYear
    1990
  • fDate
    3/1/1990 12:00:00 AM
  • Firstpage
    40
  • Lastpage
    43
  • Abstract
    The task of validly quantifying variations in electrical activity recorded when the brain is processing external or internal events is addressed. Three new statistical tests sensitive to different types of response changes, which test the null hypothesis that there is a homogeneous signal, are presented. In the case of latency jitter, the testing procedure was developed together with a procedure for estimating the unknown signal shifts. The tests provide a statistically valid and powerful tool in investigating signal variation, even with strong colored noise. Moreover, the differential sensitivity to different types of variations allows a study of the underlying signal variability even though the single signal cannot be estimated.<>
  • Keywords
    bioelectric potentials; brain; electroencephalography; signal detection; statistical analysis; differential sensitivity; homogeneous signal; latency jitter; null hypothesis; response changes; signal shifts; signal variation; statistical tests; testing procedure; variable single evoked brain potentials; variations in electrical activity; Background noise; Biological system modeling; Brain modeling; Delay; Electroencephalography; Psychology; Signal to noise ratio; Smoothing methods; Statistical analysis; Testing;
  • fLanguage
    English
  • Journal_Title
    Engineering in Medicine and Biology Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0739-5175
  • Type

    jour

  • DOI
    10.1109/51.62903
  • Filename
    62903