DocumentCode
1275955
Title
Characterisation of high-speed multiconductor interconnections
Author
Znamirowski, L. ; Palusinski, O.A.
Author_Institution
Dept. of Autom. Control, Electron. & Informatics, Silesian Univ. of Technol., Gliwice, Poland
Volume
149
Issue
2
fYear
2002
fDate
3/1/2002 12:00:00 AM
Firstpage
85
Lastpage
91
Abstract
The paper presents a method for the determination of the capacitance matrix needed in modelling and simulation of signal transmission in multiple coupled interconnecting lines. The method utilises capacitance measurements and thus one of its useful application areas is in the validation of numerous previously published algorithms based on various approximations to field equations, originally developed for the computation of capacitance matrices. The technique described is based on the active separation of the capacitance network, achieved through the use of a unity-gain amplifier. Thanks to the circuit configurations introduced with a unity-gain amplifier it is possible to make direct capacitance measurements in the multiconductor interconnecting structures. Measurement procedures are described and analysis of errors in measured quantities caused by the imperfections of measuring equipment is discussed. A sample of results obtained in measuring manufactured test structures is included for illustration of the method and measuring procedures
Keywords
capacitance measurement; equivalent circuits; measurement errors; multiconductor transmission lines; transmission line matrix methods; Maxwell matrix; T matrix measurements; active separation; capacitance matrix; capacitance network; direct capacitance measurements; equivalent circuit; field equations; high-speed integrated circuits; high-speed multiconductor interconnections; lossless multiconductor metal lines; modelling; multiconductor transmission lines; multiple coupled interconnecting lines; signal transmission; simulation; unity-gain amplifier;
fLanguage
English
Journal_Title
Science, Measurement and Technology, IEE Proceedings -
Publisher
iet
ISSN
1350-2344
Type
jour
DOI
10.1049/ip-smt:20020154
Filename
997793
Link To Document