DocumentCode :
1276221
Title :
The Universal´ dielectric response. II
Author :
Jonscher, A.K.
Author_Institution :
R. Holloway & Bedford New Coll., London, UK
Volume :
6
Issue :
3
fYear :
1990
Firstpage :
24
Lastpage :
28
Abstract :
For pt.I see ibid., vol.6, no.2, p.16-22 (1990). In the first part it was shown that the virtually universally observed relaxation behavior of solid dielectrics is radically incompatible with the classical Debye behavior. It was also pointed out that the widely accepted interpretation in terms of distributions of relaxation times does not answer the needs of the situation. Other proposed interpretations are examined here. They are: stochastic hopping processes, diffusive or Warburg response, Maxwell-Wagner processes, fractal processes, many-body phenomena, and the energy criterion.<>
Keywords :
dielectric relaxation; fractals; hopping conduction; Maxwell-Wagner processes; Warburg response; energy criterion; fractal processes; many-body phenomena; relaxation behavior; solid dielectrics; stochastic hopping processes; Conducting materials; Dielectrics; Educational institutions; Electron emission; Electron traps; Frequency dependence; Permittivity; Semiconductor impurities; Semiconductor materials; Solids;
fLanguage :
English
Journal_Title :
Electrical Insulation Magazine, IEEE
Publisher :
ieee
ISSN :
0883-7554
Type :
jour
DOI :
10.1109/57.55287
Filename :
55287
Link To Document :
بازگشت