• DocumentCode
    1276221
  • Title

    The Universal´ dielectric response. II

  • Author

    Jonscher, A.K.

  • Author_Institution
    R. Holloway & Bedford New Coll., London, UK
  • Volume
    6
  • Issue
    3
  • fYear
    1990
  • Firstpage
    24
  • Lastpage
    28
  • Abstract
    For pt.I see ibid., vol.6, no.2, p.16-22 (1990). In the first part it was shown that the virtually universally observed relaxation behavior of solid dielectrics is radically incompatible with the classical Debye behavior. It was also pointed out that the widely accepted interpretation in terms of distributions of relaxation times does not answer the needs of the situation. Other proposed interpretations are examined here. They are: stochastic hopping processes, diffusive or Warburg response, Maxwell-Wagner processes, fractal processes, many-body phenomena, and the energy criterion.<>
  • Keywords
    dielectric relaxation; fractals; hopping conduction; Maxwell-Wagner processes; Warburg response; energy criterion; fractal processes; many-body phenomena; relaxation behavior; solid dielectrics; stochastic hopping processes; Conducting materials; Dielectrics; Educational institutions; Electron emission; Electron traps; Frequency dependence; Permittivity; Semiconductor impurities; Semiconductor materials; Solids;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/57.55287
  • Filename
    55287