DocumentCode
1276221
Title
The Universal´ dielectric response. II
Author
Jonscher, A.K.
Author_Institution
R. Holloway & Bedford New Coll., London, UK
Volume
6
Issue
3
fYear
1990
Firstpage
24
Lastpage
28
Abstract
For pt.I see ibid., vol.6, no.2, p.16-22 (1990). In the first part it was shown that the virtually universally observed relaxation behavior of solid dielectrics is radically incompatible with the classical Debye behavior. It was also pointed out that the widely accepted interpretation in terms of distributions of relaxation times does not answer the needs of the situation. Other proposed interpretations are examined here. They are: stochastic hopping processes, diffusive or Warburg response, Maxwell-Wagner processes, fractal processes, many-body phenomena, and the energy criterion.<>
Keywords
dielectric relaxation; fractals; hopping conduction; Maxwell-Wagner processes; Warburg response; energy criterion; fractal processes; many-body phenomena; relaxation behavior; solid dielectrics; stochastic hopping processes; Conducting materials; Dielectrics; Educational institutions; Electron emission; Electron traps; Frequency dependence; Permittivity; Semiconductor impurities; Semiconductor materials; Solids;
fLanguage
English
Journal_Title
Electrical Insulation Magazine, IEEE
Publisher
ieee
ISSN
0883-7554
Type
jour
DOI
10.1109/57.55287
Filename
55287
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