DocumentCode :
1276355
Title :
Modeling Facility Effects on Secondary Electron Emission Experiment
Author :
Wang, Joseph ; Wang, Pu ; Belhaj, Mohamed ; Velez, Jean-Charles Mateo
Author_Institution :
Dept. of Astronaut. Eng., Univ. of Southern California, Los Angeles, CA, USA
Volume :
40
Issue :
10
fYear :
2012
Firstpage :
2773
Lastpage :
2780
Abstract :
Secondary electron emission is one of the most fundamental problems in spacecraft charging. An accurate prediction of secondary electron yield at low-energy electron impingement has long been a challenging problem due to both the complexity of the process and the difficulty in carrying out accurate measurements in a vacuum chamber. This paper discusses a correlated modeling and experimental study to investigate the facility effects on secondary electron emission yield measurement in a vacuum chamber.
Keywords :
secondary electron emission; spacecraft charging; low-energy electron impingement; process complexity; secondary electron emission experiment; spacecraft charging; vacuum chamber; Electric potential; Electron beams; Electron emission; Extraterrestrial measurements; IEEE Potentials; Materials; Mathematical model; Charging; particle in cell (PIC); secondary electron emission;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2012.2211041
Filename :
6290418
Link To Document :
بازگشت