Title :
Circuit approaches to increasing IGBT switching speed
Author :
Boisvert, David M. ; Liu, David K Y ; Plummer, James D.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
fDate :
10/1/1988 12:00:00 AM
Abstract :
Circuit techniques which greatly speed up the turn-off process of the insulated-gate bipolar transistor (IGBT) are presented. The circuits apply voltage to an external capacitor while the IGBT is in the ON state, and use this voltage to extract the excess charge stored in the base region of the device when the gate is turned off. An n+ diffusion has been added to the n- base to facilitate this extraction. The circuitry does not affect the intrinsic ON resistance of the IGBT and thus avoids the usual ON-resistance/switching-speed trade-off. The area associated with the n+ diffusion adds to the area of the IGBT, and thus increases the specific ON resistance of the device. Test devices have been fabricated and turn-off times of 500 ns have been achieved
Keywords :
bipolar transistors; insulated gate field effect transistors; power transistors; semiconductor device models; 500 ns; IGBT modification; ON resistance; external capacitor; external circuitry; insulated-gate bipolar transistor; switching speed; turn off speed up; turn-off times; Circuit testing; Implants; Insulated gate bipolar transistors; Insulation; MOSFET circuits; Power MOSFET; Student members; Switched capacitor circuits; Switching circuits; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of