DocumentCode :
1276557
Title :
A 1/2-in, 1.3 M-pixel progressive-scan CCD image sensor employing 0.25-μm gap single-layer poly-Si electrodes
Author :
Furumiya, Masayuki ; Hatano, Keisuke ; Nakashiba, Yasutaka ; Murakami, Ichiro ; Yamada, Tohru ; Nakano, Takashi ; Kawakami, Yukiya ; Kawasaki, Toru ; Hokari, Yasuaki
Author_Institution :
ULSI Device Dev. Lab., NEC Corp., Kanagawa, Japan
Volume :
34
Issue :
12
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
1835
Lastpage :
1842
Abstract :
A 1/2-in, 1.3 M-pixel progressive-scan interline-transfer charge coupled-device (IT-CCD) image sensor has been developed for low-power and high-sensitivity digital cameras. The image sensor uses 0.25-μm gap single-layer poly-Si for CCD transfer electrodes in order to reduce the power consumption and number of fabrication process steps. The image sensor achieved a low driving voltage (2.1 V) on a horizontal CCD (H-CCD) at a frequency of 24.5 MHz. An original pixel layout and a self-aligned photodiode structure make it possible to achieve a progressive scan pixel with well-controlled photodiode readout characteristics. An output three-stage source follower amplifier with new multioxide transistors, whose gate insulator thickness is thinner than that of a CCD register, is able to attain 17% higher gain than that of the conventional amplifier. The sensor provides low-power (100 mW) and high output sensitivity. The total number of steps for fabricating the sensor was reduced to 70% of that for conventional three-layer poly-Si electrodes
Keywords :
CCD image sensors; electrodes; elemental semiconductors; low-power electronics; silicon; 0.25 micron; 0.5 in; 1.3 Mpixel; 100 mW; 2.1 V; 24.5 MHz; Si; fabrication; horizontal CCD; low-power digital camera; multioxide transistor; progressive-scan interline-transfer CCD image sensor; self-aligned photodiode; sensitivity; single-layer polysilicon electrode; three-stage source-follower amplifier; Charge coupled devices; Charge-coupled image sensors; Digital cameras; Electrodes; Energy consumption; Fabrication; Frequency; Image sensors; Low voltage; Photodiodes;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.808908
Filename :
808908
Link To Document :
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