• DocumentCode
    1276801
  • Title

    Enhanced testing of VLSI devices

  • Author

    Meredith, Richard

  • Author_Institution
    Marconi Instruments Ltd., ATE Division, St. Albans, UK
  • Volume
    29
  • Issue
    6
  • fYear
    1983
  • fDate
    6/1/1983 12:00:00 AM
  • Firstpage
    499
  • Lastpage
    501
  • Abstract
    The in-circuit test technique, rather than functional testing, is in widespread use in the testing of printed-circuit-board components. This article highlights the facilities of today´s in-circuit automatic test equipment with particular reference to one manufacturer´s new product range
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1983.0226
  • Filename
    5186805
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1276801