• DocumentCode
    1276863
  • Title

    The Quantum Point-Contact Memristor

  • Author

    Miranda, E. ; Jiménez, D. ; Suñé, J.

  • Author_Institution
    Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Barcelona, Spain
  • Volume
    33
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1474
  • Lastpage
    1476
  • Abstract
    Among the wide variety of electron devices and systems that exhibit pinched hysteresis current-voltage (I-V) characteristics, those associated with filamentary-like conduction have attracted significant attention in the last years because of their potential relevance in the field of nonvolatile memories. At the nanoscale, the quantum conductance unit G0 = 2e2/h, where e is the electron charge and h is the Planck constant, establishes a well-defined upper current limit I = G0V for the monomode ballistic conductor. Here, we explore two possible mechanisms that can lead to lower conductance loops: continuous modulation of the constriction´s potential profile and discrete changes of the transmission probability through a chain of identical scatterers. The connection with the so-called memristive systems is also discussed.
  • Keywords
    conductors (electric); memristors; nanoelectronics; probability; quantum point contacts; random-access storage; I-V characteristics; Planck constant; conductance loops; constriction potential profile; continuous modulation; electron charge; electron devices; filamentary-like conduction; memristive systems; monomode ballistic conductor; nonvolatile memories; pinched hysteresis current-voltage characteristics; quantum conductance unit; quantum point-contact memristor; transmission probability; Equations; Materials; Mathematical model; Memristors; Nonvolatile memory; Resistance; Switches; Memristor; RRAM; resistive switching;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2210185
  • Filename
    6291744