• DocumentCode
    1277045
  • Title

    Analysis and Comparison of Turn-off Active Gate Control Methods for Low-Voltage Power MOSFETs With High Current Ratings

  • Author

    Wittig, Bjoern ; Fuchs, Friedrich Wilhelm

  • Author_Institution
    Inst. of Power Electron. & Electr. Drives, Christian-Albrechts-Univ. of Kiel, Kiel, Germany
  • Volume
    27
  • Issue
    3
  • fYear
    2012
  • fDate
    3/1/2012 12:00:00 AM
  • Firstpage
    1632
  • Lastpage
    1640
  • Abstract
    An analysis and improvement of the switching behavior of low-voltage power MOSFETs with high current ratings is presented. At turn-off, a high overvoltage arises for power MOSFETs. An improvement can be achieved by means of lowering the current slope via the driving stage during switching. Likewise, the current slope can exceed the required limits despite high gate resistances. These problems are of major concern for low-voltage power MOSFETs and can be solved via the driving stage. Thus, turn-off active gate control methods are analyzed and their performance is investigated focusing on reducing the overvoltage at turn-off under the precondition of only a minor increase of switching losses. With only a small number of additional components, a remarkable reduction of turn-off losses is achieved. Thus, these methods are well suited to industrial applications. The control concepts are experimentally compared to a basic gate drive circuit.
  • Keywords
    driver circuits; overvoltage; power MOSFET; thyristors; control concept; current slope; driving stage; gate drive circuit; gate resistance; high current rating; industrial application; low-voltage power MOSFET; switching behavior; switching loss; turn-off active gate control method; Inductance; Logic gates; Low voltage; MOSFETs; Optical switches; Voltage control; Driver circuits; losses; overvoltage protection; power MOSFETs; switching transients;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2011.2162531
  • Filename
    5958615