DocumentCode :
1277136
Title :
Analysis of N-furcation in elliptical waveguides via the generalized network formulation
Author :
Mongiardo, Mauro ; Russer, Peter ; Tomassoni, Cristiano ; Felsen, Leopold B.
Author_Institution :
Ist. di Elettronica, Perugia, Italy
Volume :
47
Issue :
12
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
2473
Lastpage :
2478
Abstract :
We consider the problem of an N-furcated elliptical waveguide, i.e., the problem of the junction between an elliptical waveguide of larger cross section and a few elliptical waveguides of smaller cross section. This problem is relevant for several applications since it allows full-wave modeling of a thick iris containing multiple elliptical apertures, and by proper selection of such an iris, it is possible to control mode excitation and coupling. In order to deal with the above problem, we employ the recently introduced generalized network formulation, which allows one to solve the N-furcation problem not only in the standard manner but also via scattering superposition. The efficiency of both proposed approaches is tied to the coupling-coefficient evaluation. For implementation, we introduce new analytical formulas, which considerably reduce the computational effort. Numerical and experimental comparisons are provided in order to validate the theory
Keywords :
Green´s function methods; bifurcation; coupled mode analysis; mode matching; waveguide discontinuities; Green´s function; N-furcation analysis; bifurcation; coupling-coefficient evaluation; elliptical waveguides; full-wave modeling; generalized network formulation; mode coupling; mode excitation; mode matching; multimodal filter design; multiple elliptical apertures; scattering superposition; thick iris; waveguide discontinuities; Apertures; Intelligent networks; Iris; Microwave filters; Rectangular waveguides; Scattering; Transformers; Waveguide discontinuities; Waveguide junctions; Waveguide transitions;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.808995
Filename :
808995
Link To Document :
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