• DocumentCode
    1277155
  • Title

    Spurious transmission effects due to the excitation of the bound mode and the continuous spectrum on stripline with an air gap

  • Author

    Friere, M.J. ; Mesa, Francisco ; Di Nallo, Carlo ; Jackson, David R. ; Oliner, Arthur A.

  • Author_Institution
    Dept. de Electron. y Electromagn., Seville Univ., Spain
  • Volume
    47
  • Issue
    12
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    2493
  • Lastpage
    2502
  • Abstract
    The nature of the strip current excited by a practical delta-gap source on a stripline structure with an air gap above the strip conductor is studied. This structure supports the existence of a dominant leaky mode (LM) in addition to a bound mode of propagation. It is shown that the total current on the strip excited by the source can be resolved into the sum of a bound-mode current and a continuous-spectrum current, with the latter current further represented as the sum of all physical LM currents and a “residual-wave” current. The roles of the various current components are investigated numerically as the frequency and air-gap thickness change. The appearance of a spurious sharp dip in the transmission response is demonstrated numerically and explained theoretically, and numerical results are compared with measurements. Since such a transmission dip can always occur for an appropriate set of parameter values, it is important to be able to understand and predict this effect
  • Keywords
    crosstalk; microwave circuits; packaging; strip lines; air gap; air-gap thickness change; bound mode; continuous spectrum; continuous-spectrum current; delta-gap source; dominant leaky mode; parameter values; physical LM currents; residual-wave current; spurious transmission effects; strip current; stripline; Air gaps; Associate members; Conductors; Crosstalk; Frequency; Helium; Microwave circuits; Packaging; Stripline; Strips;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.808998
  • Filename
    808998