Active probes for network analysis within 70-230 GHz

Author

Wohlgemuth, Oliver ; Rodwell, Mark J.W. ; Reuter, Ralf ; Braunstein, Jürgen ; Schlechtweg, Michael

Author_Institution

Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany

Volume

47

Issue

12

fYear

1999

fDate

12/1/1999 12:00:00 AM

Firstpage

2591

Lastpage

2598

Abstract

This paper presents a vector network analyzer system for the 70-230-GHz bandwidth. The instrument employs active probes for millimeter-wave signal generation and detection, and for signal delivery to the device-under-test. Milimeter-wave signals are generated and detected within the active probes using an integrated circuit (IC) based on nonlinear transmission lines. The IC contains all elements of an S-parameter test set: a multiplier to generate the radio-frequency signal, directional couplers to separate the incident and reflected waves, and a pair of high-speed sampling circuits to convert the signals down to lower frequencies. Two-port measurements over the 70-230-GHz bandwidth are demonstrated, including those of directional couplers and millimeter-wave high electron-mobility transistors

Keywords

S-parameters; millimetre wave measurement; network analysers; probes; 70 to 230 GHz; RF signal; S-parameter testing; active probe; directional coupler; frequency multiplier; high electron mobility transistor; high-speed sampling circuit; integrated circuit; millimeter-wave signal detection; millimeter-wave signal generation; nonlinear transmission line; signal delivery; two-port measurement; vector network analyzer; Bandwidth; Circuit testing; Directional couplers; Millimeter wave measurements; Millimeter wave transistors; Probes; RF signals; Radiofrequency integrated circuits; Signal detection; Signal generators;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.809011

Filename

809011