Title :
SICS: a sensor interaction compensation scheme for microwave imaging
Author :
Franza, Olivier ; Joachimowicz, Nadine ; Bolomey, Jean-Charles
fDate :
2/1/2002 12:00:00 AM
Abstract :
A new formulation is proposed to take into account the sensors used to measure the scattered field in microwave tomography setups. This formulation provides a way to fully compensate the perturbations resulting from the presence of an array of sensors around the target under test. A simple example is given to illustrate how this compensation can be implemented on an iterative Newton-Kantorovich reconstruction algorithm and to demonstrate its efficiency
Keywords :
Newton method; array signal processing; electromagnetic fields; electromagnetic wave scattering; image reconstruction; inverse problems; microwave imaging; iterative Newton-Kantorovich reconstruction algorithm; microwave imaging; microwave tomography; nonlinear inverse scattering; scattered field measurement; sensor interaction compensation scheme; sensors array; target under test; Equations; Image reconstruction; Image sensors; Microwave imaging; Microwave sensors; Scattering; Sensor arrays; Silicon carbide; Testing; Tomography;
Journal_Title :
Antennas and Propagation, IEEE Transactions on