Stress-induced frequency shifts of degenerate thickness-shear modes in rotated Y-cut quartz resonators

Author

Kosinski, J.A. ; Pastore, Robert A ; Jiashi Yang ; Xiaomeng Yang ; Turner, J.A.

Author_Institution

U.S. Army CECOM, Fort Monmouth, NJ, USA

Volume

57

Issue

8

fYear

2010

fDate

8/1/2010 12:00:00 AM

Firstpage

1880

Lastpage

1883

Abstract

We study stress-induced frequency shifts in a rotated Y-cut quartz resonator (θ = 23.7°) with degenerate fundamental thickness-shear modes when the biasing stress is not present. Using the recently derived perturbation procedure for degenerate frequencies in crystal resonators, we show that when a planar stress system is applied, the degenerate frequency splits into two. This phenomenon is expected to be typical for degenerate frequencies in crystal resonators and may be responsible in part for the jump discontinuities in frequency temperature curves and other frequency jump phenomena.

Keywords

crystal resonators; internal stresses; perturbation theory; shear deformation; biasing stress; crystal resonators; degenerate frequency; degenerate fundamental thickness-shear modes; frequency temperature curves; other frequency jump phenomena; perturbation procedure; planar stress system; quartz resonators; stress-induced frequency shift; Acoustics; Crystals; Eigenvalues and eigenfunctions; Frequency control; Optical resonators; Resonant frequency; Stress;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2010.1628

Filename

5529478