DocumentCode :
1277468
Title :
Stress-induced frequency shifts of degenerate thickness-shear modes in rotated Y-cut quartz resonators
Author :
Kosinski, J.A. ; Pastore, Robert A ; Jiashi Yang ; Xiaomeng Yang ; Turner, J.A.
Author_Institution :
U.S. Army CECOM, Fort Monmouth, NJ, USA
Volume :
57
Issue :
8
fYear :
2010
fDate :
8/1/2010 12:00:00 AM
Firstpage :
1880
Lastpage :
1883
Abstract :
We study stress-induced frequency shifts in a rotated Y-cut quartz resonator (θ = 23.7°) with degenerate fundamental thickness-shear modes when the biasing stress is not present. Using the recently derived perturbation procedure for degenerate frequencies in crystal resonators, we show that when a planar stress system is applied, the degenerate frequency splits into two. This phenomenon is expected to be typical for degenerate frequencies in crystal resonators and may be responsible in part for the jump discontinuities in frequency temperature curves and other frequency jump phenomena.
Keywords :
crystal resonators; internal stresses; perturbation theory; shear deformation; biasing stress; crystal resonators; degenerate frequency; degenerate fundamental thickness-shear modes; frequency temperature curves; other frequency jump phenomena; perturbation procedure; planar stress system; quartz resonators; stress-induced frequency shift; Acoustics; Crystals; Eigenvalues and eigenfunctions; Frequency control; Optical resonators; Resonant frequency; Stress;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1628
Filename :
5529478
Link To Document :
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