Title :
Calculating electromagnetic coupling between isolated power islands by 2D-FDTD with equivalent circuits
Author :
Chun-Te Wu ; Po-Yi Chu ; Cheng-Nan Chiu ; Yen-Tang Chang ; Han-Chang Hsieh
Author_Institution :
Dept. of Electr. Eng., Da-Yeh Univ., Changhua, Taiwan
Abstract :
Two-dimensional finite difference time domain (2D-FDTD) method is a very powerful electromagnetic numerical method for simulating electromagnetic(EM) problems of a complicated printed circuit board (PCB). However, due to the lack of transversal components of electric field intensities, it is hard to contain the coupling effect among isolated power/ground islands. In order to simulated the EM performance of the whole PCB, a set of equivalent circuits between adjacent two edges of isolated islands are used to calculate the coupling. First, the scattering parameters (S-parameters) of multiple ports are obtained from measurement by network analyzer or simulation by full wave EM solver. Then, a mode extraction approach is applied to those S-parameters to obtain the coupling modes. Finally, a set of equivalent circuits can be obtained. Those circuits can be combined with 2D-FDTD method to calculate signal integrity (SI), and power integrity (PI) including coupling between isolated islands.
Keywords :
S-parameters; circuit simulation; computational electromagnetics; electromagnetic coupling; electromagnetic wave scattering; finite difference time-domain analysis; network analysers; printed circuits; 2D-FDTD method; 2D-finite difference time domain method; S-parameters; electric field intensities; electromagnetic coupling calculation; electromagnetic numerical method; electromagnetic problem simulation; equivalent circuits; full wave EM solver; isolated ground islands; isolated power islands; mode extraction approach; network analyzer; power integrity calculation; printed circuit board; scattering parameters; signal integrity calculation; Couplings; Electromagnetic compatibility; Equivalent circuits; Integrated circuit modeling; Scattering parameters; Silicon; Testing; Two-dimensional finite difference time domain method (2D-FDTD); power integrity (PI); printed circuit board (PCB); scattering parameters (S-parameters); signal integrity (SI);
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
DOI :
10.1109/EMCEurope.2014.6930903