• DocumentCode
    1278263
  • Title

    Modeling of the CoolMOSTM transistor. II. DC model and parameter extraction

  • Author

    Daniel, Bobby J. ; Parikh, Chetan D. ; Patil, Mahesh B.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Mumbai, India
  • Volume
    49
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    923
  • Lastpage
    929
  • Abstract
    An accurate dc model for the CoolMOSTM power transistor is presented. An elementary model consisting of an intrinsic MOSFET and a JFET to represent the drift region, is first discussed and it is pointed out that this is a rather poor model, needing improvements. Using device simulation results, it is shown that, by replacing the gate and drain voltages of the intrinsic MOSFET by appropriate "effective" voltages, a highly accurate model is obtained. A systematic procedure for parameter extraction is described and an implementation of the new model in the form of a SPICE subcircuit is given
  • Keywords
    SPICE; parameter estimation; power MOSFET; semiconductor device models; CoolMOS power transistor; JFET; SPICE subcircuit; dc model; device simulation; drift region; effective voltages; highly accurate model; intrinsic MOSFET; parameter extraction; Circuit simulation; Doping; MOSFET circuits; Parameter extraction; Power MOSFET; Power system modeling; Power transistors; SPICE; Semiconductor process modeling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.998604
  • Filename
    998604