• DocumentCode
    1278412
  • Title

    Electromagnetic interconnects and passives modeling: software implementation issues

  • Author

    Schoenmaker, Wim ; Meuris, Peter

  • Author_Institution
    IMEC, Heverlee, Belgium
  • Volume
    21
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    534
  • Lastpage
    543
  • Abstract
    This is the second paper in a series on the simulation of on-chip high-frequency effects. A computer-aided approach in three dimensions is advocated, describing high-frequency effects such as current redistribution due to the skin-effect or eddy currents and the occurrence of slow-wave modes. The electromagnetic environment is described by an electric scalar potential and a magnetic vector potential as well as a ghost field. The latter one guarantees a stable numerical implementation. This paper deals with the software implementation, the treatment of interfaces and domain boundaries, scaling considerations, numbering schemes, and solver requirements. Some illustrative examples are shown
  • Keywords
    circuit simulation; current distribution; eddy currents; electromagnetic field theory; integrated circuit interconnections; integrated circuit modelling; numerical stability; skin effect; technology CAD (electronics); 3-D computer-aided approach; TCAD software environment; current redistribution; eddy currents; electric scalar potential; electromagnetic interconnects; ghost field; magnetic vector potential; numbering schemes; on-chip high-frequency effects; passives modeling; scaling considerations; skin-effect; slow-wave modes; software implementation; solver requirements; stable numerical implementation; Computational modeling; Current density; Dielectric losses; Differential equations; Eddy currents; Electromagnetic fields; Electromagnetic modeling; Frequency; Maxwell equations; Permittivity;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.998625
  • Filename
    998625