DocumentCode :
1278458
Title :
Novel Electronic Devices in Macroporous Silicon: Design of FET Transistors for Power Applications
Author :
Rodríguez, A. ; Vega, D. ; Najar, R. ; Pina, M.
Author_Institution :
Dept. d´´Eng. Electron., Univ. Politec. de Catalunya, Barcelona, Spain
Volume :
58
Issue :
9
fYear :
2011
Firstpage :
3065
Lastpage :
3071
Abstract :
In this paper, we study the application of macroporous silicon (MpSi) to the fabrication of transistors: Four different FET transistor structures are proposed using MpSi as the base material. These devices have been studied by simulation, and their characteristics are shown herein. The proposed structures include JFET, MOSFET, and trio de-like devices; in this study, we have considered both vertical and horizontal structures. For the vertical case, the proposed devices use the MpSi tubes to create the channel, filling them with a semiconductor and using the bulk silicon as a cylindrical gate all around. In contrast, for the horizontal transistors, the MpSi structure is used as the channel medium, while the conductor-filled pores serve as the controlling gate, thus obtaining a trio de-like device. The use of MpSi allows one to obtain large transistor arrays of extremely high density, thus obtaining a large amount of parallel devices in a moderate-to-small device area. Even more, pore engineering introduces a degree of freedom in the design of the transistor characteristics. We show that the proposed devices have a low threshold voltage and can support large currents. Finally, the behavior of these structures is studied for different geometries.
Keywords :
MOSFET; junction gate field effect transistors; porous semiconductors; semiconductor device models; silicon; FET transistor structures; FET transistors; JFET; MOSFET; Si; bulk silicon; conductor-filled pores; controlling gate; cylindrical gate; degree of freedom; electronic devices; horizontal structures; horizontal transistors; macroporous silicon; moderate-to-small device area; parallel devices; pore engineering; power applications; threshold voltage; transistor arrays; transistor characteristics; transistor fabrication; trio de-like devices; vertical structures; Doping; JFETs; Logic gates; Performance evaluation; Semiconductor process modeling; Silicon; 3-D transistor; All-around gate; FET transistors; JFET; MOSFET; device modeling; macroporous silicon (MpSi); surrounding gate;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2011.2159508
Filename :
5959197
Link To Document :
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