DocumentCode :
1278575
Title :
Photon-Quantum-Noise-Limited Pixel Architecture in Amorphous-Silicon Technology for Large-Area Digital Imaging Applications
Author :
Yazdandoost, Mohammad Y. ; Karim, Karim S.
Author_Institution :
Teledyne DALSA, Waterloo, ON, Canada
Volume :
59
Issue :
11
fYear :
2012
Firstpage :
3017
Lastpage :
3023
Abstract :
An X-ray photon-quantum-noise-limited voltage-controlled oscillator (VCO)-based pixel architecture in amorphous-silicon (a-Si) technology is reported for large-area digital medical imaging applications. In this research, the X-ray generated input charge on the input capacitor is converted into an oscillating frequency signal output at the pixel level. The VCO pixel is fabricated in-house using a-Si technology, and experimental results are presented. Readout circuitry is proposed which can be optimized to reduce the fixed pattern noise and fringing effects in an imaging array containing many such VCO pixels. The phase noise and stability performance of the single-pixel VCO are measured and analyzed. This architecture has the lowest input referred noise among all reported a-Si pixel architectures and is the first photon-quantum-noise-limited pixel architecture in a-Si technology. The pixel´s valid input range is measured to be 120 e- all the way to 5 ×106 e-. This shows that the pixel has a very high dynamic range. The proposed architecture is particularly promising for large-area photon-quantum-noise-limited digital imaging applications (e.g., protein crystallography) due to its small input referred electronic noise, high sensitivity, and ease of fabrication in large-area a-Si technology.
Keywords :
X-ray imaging; amorphous semiconductors; capacitors; digital readout; elemental semiconductors; image denoising; image sensors; medical image processing; phase noise; photon counting; quantum noise; sensor arrays; silicon; voltage-controlled oscillators; Si; VCO pixel; X-ray imaging; amorphous silicon technology; capacitor; digital medical imaging; electronic noise; fixed pattern noise; fringing effect; imaging array; optimization; phase noise; photon quantum noise limited pixel architecture; readout circuitry; stability performance; voltage controlled oscillator; Capacitance; Capacitors; Noise measurement; Photonics; Thin film transistors; Voltage-controlled oscillators; Active pixel sensor; amorphous silicon (a-Si); large-area electronics; medical imaging; quantum noise; ring oscillator; thin-film transistor (TFT); voltage-controlled oscillator (VCO);
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2212708
Filename :
6294441
Link To Document :
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