Title :
Phase noise and a low-frequency noise reduction method in bipolar transistors
Author :
Takagi, Keiji ; Serikawa, S. ; Kurita, T.
Author_Institution :
Dept. of Electron., Kyushu Inst. of Technol., Kitakyushu, Japan
fDate :
7/1/1997 12:00:00 AM
Abstract :
A low-frequency amplitude and phase-noise measuring system was set up and both noises were measured. It is noted they were correlated in a bipolar transistor. Both noises were from the same origin: diffusion coefficient fluctuation in the base. A demonstration was carried out on the amplitude noise reduction by using the correlation between both noises
Keywords :
1/f noise; bipolar transistors; electric noise measurement; phase noise; semiconductor device noise; LF noise reduction method; amplitude noise measurement; bipolar transistors; diffusion coefficient fluctuation; noise measuring system; phase noise measurement; Bipolar transistors; Electron emission; Fluctuations; Frequency; Low-frequency noise; Noise level; Noise measurement; Noise reduction; Phase measurement; Phase noise;
Journal_Title :
Electron Devices, IEEE Transactions on
