DocumentCode
1279227
Title
Phase noise and a low-frequency noise reduction method in bipolar transistors
Author
Takagi, Keiji ; Serikawa, S. ; Kurita, T.
Author_Institution
Dept. of Electron., Kyushu Inst. of Technol., Kitakyushu, Japan
Volume
44
Issue
7
fYear
1997
fDate
7/1/1997 12:00:00 AM
Firstpage
1180
Lastpage
1181
Abstract
A low-frequency amplitude and phase-noise measuring system was set up and both noises were measured. It is noted they were correlated in a bipolar transistor. Both noises were from the same origin: diffusion coefficient fluctuation in the base. A demonstration was carried out on the amplitude noise reduction by using the correlation between both noises
Keywords
1/f noise; bipolar transistors; electric noise measurement; phase noise; semiconductor device noise; LF noise reduction method; amplitude noise measurement; bipolar transistors; diffusion coefficient fluctuation; noise measuring system; phase noise measurement; Bipolar transistors; Electron emission; Fluctuations; Frequency; Low-frequency noise; Noise level; Noise measurement; Noise reduction; Phase measurement; Phase noise;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.595950
Filename
595950
Link To Document