DocumentCode :
127924
Title :
FDTD analysis of 3D lightning problems with material uncertainties on GPU architecture
Author :
Pyrialakos, Georgios ; Zygiridis, Theodoros ; Kantartzis, Nikolaos ; Tsiboukis, Theodoros
Author_Institution :
Dept. of Electr. & Comput. Eng., Aristotle Univ. of Thessaloniki, Thessaloniki, Greece
fYear :
2014
fDate :
1-4 Sept. 2014
Firstpage :
577
Lastpage :
582
Abstract :
We present a computational framework for the prediction of electromagnetic fields in lightning problems which, unlike common methodologies, can efficiently incorporate the statistical variations that characterize the ground electric parameters. Our full-wave technique is based on the three-dimensional (3D) extension of the stochastic finite-difference time-domain (S-FDTD) method, and enables the extraction - in a single run - of fundamental statistical parameters, such as the mean value and standard deviation, that describe the generated fields. Aiming at efficient code implementations via paralellization, the increased computing power of modern graphics processing units (GPUs) is exploited. Numerical tests verify the validity of the proposed approach, as the corresponding results compare very well with those obtained via - more time-consuming - Monte-Carlo FDTD (MC-FDTD) simulations, for a wide range of parameter values.
Keywords :
Monte Carlo methods; finite difference time-domain analysis; graphics processing units; stochastic processes; 3D lightning problems; FDTD analysis; GPU architecture; MC-FDTD simulation; Monte-Carlo FDTD simulation; S-FDTD method; code implementation; computing power; electromagnetic field; full-wave technique; fundamental statistical parameter; graphics processing unit; ground electric parameter; material uncertainty; mean value and standard deviation; statistical variation; stochastic finite-difference time-domain; Electromagnetic compatibility; Finite difference methods; Graphics processing units; Kernel; Lightning; Standards; Time-domain analysis; GPU computing; lightning; parameter uncertainties; statistical fluctuations; stochastic FDTD method;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
Type :
conf
DOI :
10.1109/EMCEurope.2014.6930972
Filename :
6930972
Link To Document :
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